Invention Grant
- Patent Title: Method for memory testing
- Patent Title (中): 内存测试方法
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Application No.: US12007115Application Date: 2008-01-07
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Publication No.: US07783926B2Publication Date: 2010-08-24
- Inventor: Chi-Yuan Chu Chen
- Applicant: Chi-Yuan Chu Chen
- Applicant Address: TW Taipei
- Assignee: Inventec Corporation
- Current Assignee: Inventec Corporation
- Current Assignee Address: TW Taipei
- Agency: CKC & Partners Co., Ltd.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method for memory testing implemented on an embedded system, the method comprising steps of loading a booting program when the embedded system is booted; activating a RAM of the embedded system by the booting program; duplicating the booting program itself and writing the duplicated booting program into a first section of the RAM by the booting program; downloading a testing program from an on-line source and writing the downloaded testing program into a second section of the RAM by the duplicated booting program; and enabling the downloaded testing program to check a third section the rest part of the RAM excepting the first and second sections, after the downloaded testing program is executed by the duplicated booting program.
Public/Granted literature
- US20090177925A1 Method for memory testing Public/Granted day:2009-07-09
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