Invention Grant
- Patent Title: Method for planning an examination in a magnetic resonance system
- Patent Title (中): 计算磁共振系统检查的方法
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Application No.: US11499277Application Date: 2006-08-03
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Publication No.: US07787684B2Publication Date: 2010-08-31
- Inventor: Walter Beck , Klaus Mayer , Cecile Mohr , Jochen Zeltner
- Applicant: Walter Beck , Klaus Mayer , Cecile Mohr , Jochen Zeltner
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Schiff Hardin LLP
- Priority: DE102005036515 20050803
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/36 ; A61B5/05

Abstract:
In a method for planning an examination of an examination subject in a magnetic resonance system, the planning of the examination ensues based on a composite overview image that is composed of at least two individual images. A first part of the overview image is acquired and the first part of the overview image is made available to operating personnel of the magnetic resonance system for planning further measurements. A second part of the overview image is acquired and the first part and the second part of the overview image are combined. The combined image of the first part and second part of the overview image is made available for planning further measurements. The first part of the overview image is made available to operating personnel no later than before making the overview image available.
Public/Granted literature
- US20070036413A1 Method for planning an examination in a magnetic resonance system Public/Granted day:2007-02-15
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