Invention Grant
- Patent Title: Position-measuring device and method for position measuring
- Patent Title (中): 位置测量装置及位置测量方法
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Application No.: US11180014Application Date: 2005-07-11
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Publication No.: US07787970B2Publication Date: 2010-08-31
- Inventor: Erich Strasser , Elmar Mayer
- Applicant: Erich Strasser , Elmar Mayer
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Kenyon & Kenyon LLP
- Priority: DE102004033266 20040709
- Main IPC: G05B19/18
- IPC: G05B19/18 ; G01C9/00 ; G05B19/10 ; G05B19/31 ; H02P6/00 ; H02P1/34 ; G01C21/00 ; G01D21/00

Abstract:
A position-measuring device having integrated function testing includes a position-recording unit, a processing unit, and a control-word generator. In a positional-data request, a positional-data word is first generated in the position-recording unit and output to the processing unit. There, the position data word is processed into a position value. Subsequently, a control-data word is generated in the position-recording unit according to the specification of the control-word generator and output to the processing unit. The processing unit processes the control-data word into a control value which has a defined mathematical relationship to the position value.
Public/Granted literature
- US20060009947A1 Position-measuring device and method for position measuring Public/Granted day:2006-01-12
Information query
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