Invention Grant
- Patent Title: Redundant bit patterns for column defects coding
- Patent Title (中): 用于列缺陷编码的冗余位模式
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Application No.: US11958200Application Date: 2007-12-17
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Publication No.: US07788550B2Publication Date: 2010-08-31
- Inventor: Marc Merandat , Yves Fusella
- Applicant: Marc Merandat , Yves Fusella
- Applicant Address: FR Rousset, Cedex
- Assignee: Atmel Rousset S.A.S.
- Current Assignee: Atmel Rousset S.A.S.
- Current Assignee Address: FR Rousset, Cedex
- Agency: Fish & Richardson P.C.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/00

Abstract:
Techniques for coding and decoding redundant coding for column defects cartography. Defective cell groups identified in a memory array are redundantly encoded with a different bit pattern than the bit pattern used for functional cell groups. The identified defective cell groups are repaired using redundant cell groups in the memory array. The defective cell groups are later re-identified by checking the redundant bit pattern encoded in the cell groups. If new defective cell groups are identified, the memory array is identified as failing. If no new defective cell groups are identified, the memory array is identified as passing, and the identified defective cell groups are repaired.
Public/Granted literature
- US20090158084A1 Redundant Bit Patterns for Column Defects Coding Public/Granted day:2009-06-18
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