Invention Grant
US07788625B1 Method and apparatus for precharacterizing systems for use in system level design of integrated circuits 有权
用于集成电路系统级设计的系统前置系统的方法和装置

  • Patent Title: Method and apparatus for precharacterizing systems for use in system level design of integrated circuits
  • Patent Title (中): 用于集成电路系统级设计的系统前置系统的方法和装置
  • Application No.: US11106324
    Application Date: 2005-04-14
  • Publication No.: US07788625B1
    Publication Date: 2010-08-31
  • Inventor: Adam P. DonlinDouglas M. Densmore
  • Applicant: Adam P. DonlinDouglas M. Densmore
  • Applicant Address: US CA San Jose
  • Assignee: Xilinx, Inc.
  • Current Assignee: Xilinx, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent Marc Ascolese; Kevin T. Cuenot; Lois D. Cartier
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Method and apparatus for precharacterizing systems for use in system level design of integrated circuits
Abstract:
Systems, methods, software, and techniques can be used to precharacterize a variety of prototype system designs. The prototype system designs can be defined at one or more levels of abstraction. The prototype designs are characterized using one or more electronic design automation tools to generate precharacterization data. Precharacterization data and associated prototype designs are used either directly or indirectly in the system level design process.
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