Invention Grant
- Patent Title: Pressure measurement device and system, and method for manufacturing and using the same
- Patent Title (中): 压力测量装置和系统及其制造和使用方法
-
Application No.: US12075864Application Date: 2008-03-14
-
Publication No.: US07788981B2Publication Date: 2010-09-07
- Inventor: Noa Schmid , Helmut Knapp , Janko Auerswald , Christian Andreas Bosshard , Mark Fretz , Anne-Claire Pliska
- Applicant: Noa Schmid , Helmut Knapp , Janko Auerswald , Christian Andreas Bosshard , Mark Fretz , Anne-Claire Pliska
- Applicant Address: CH Neuchatel
- Assignee: CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Developpement
- Current Assignee: CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Developpement
- Current Assignee Address: CH Neuchatel
- Agency: Weingarten, Schurgin, Gagnebin & Lebovici LLP
- Main IPC: G01L9/06
- IPC: G01L9/06

Abstract:
The present invention discloses a pressure measurement device comprising: a substrate that includes at least one pressure sensing module and at least one fluid-conductive channel, wherein each channel has a first aperture and a second aperture. The substrate is flexible such that the pressure measurement device is conformably adjustable onto an object's surface. The first aperture is located on the substrate such that when the substrate is suitably adjusted onto the object's surface, the first aperture is open to the exterior of the object's surface. The pressure sensors module is operatively connected to at least one of the second apertures, such that the at least one pressure sensing module is generally being subjected to the pressure being present at the first aperture.
Public/Granted literature
- US20080223141A1 Pressure measurement device and system, and method for manufacturing and using the same Public/Granted day:2008-09-18
Information query