Invention Grant
- Patent Title: Selective deposition of a dielectric on a self-assembled monolayer-adsorbed metal
- Patent Title (中): 在自组装单层吸附金属上选择性沉积电介质
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Application No.: US11603522Application Date: 2006-11-21
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Publication No.: US07790631B2Publication Date: 2010-09-07
- Inventor: Ajay K. Sharma , Sean King , Dennis Hanken , Andrew W. Ott
- Applicant: Ajay K. Sharma , Sean King , Dennis Hanken , Andrew W. Ott
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: H01L21/31
- IPC: H01L21/31

Abstract:
Methods and apparatuses to selectively deposit a dielectric on a self-assembled monolayer (“SAM”) adsorbed metal are described. A wafer includes a device having a first electrode. A first self-assembled monolayer is deposited on the wafer covering the first electrode. Next, a portion of the first self-assembled monolayer is removed to expose the first electrode. The first self-assembled monolayer includes a hydrophobic layer. Further, second self-assembled monolayer is deposited on the first electrode. The second self-assembled monolayer includes a hydrophilic layer. Next, an insulating layer is deposited on the second self-assembled monolayer. Further, self-aligned contacts to one or more second electrodes of the device are formed.
Public/Granted literature
- US20080116481A1 Selective deposition of a dielectric on a self-assembled monolayer-adsorbed metal Public/Granted day:2008-05-22
Information query
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