Invention Grant
- Patent Title: Method and apparatus for specimen fabrication
- Patent Title (中): 用于样品制造的方法和装置
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Application No.: US12168241Application Date: 2008-07-07
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Publication No.: US07791050B2Publication Date: 2010-09-07
- Inventor: Satoshi Tomimatsu , Kaoru Umemura , Yuichi Madokoro , Yoshimi Kawanami , Yasunori Doi
- Applicant: Satoshi Tomimatsu , Kaoru Umemura , Yuichi Madokoro , Yoshimi Kawanami , Yasunori Doi
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Main IPC: H01J37/20
- IPC: H01J37/20

Abstract:
A specimen fabrication apparatus, including: an ion beam irradiating optical system to irradiate a sample placed in a chamber, with an ion beam; a specimen holder to mount a specimen separated by the irradiation with the ion beam; a holder cassette to hold the specimen holder; a sample stage to hold the sample and the holder cassette; and a probe to move the specimen to the specimen holder, wherein the holder cassette is transferred to outside of the chamber in a condition of holding the specimen holder with the specimen mounted.
Public/Granted literature
- US20090008578A1 METHOD AND APPARATUS FOR SPECIMEN FABRICATION Public/Granted day:2009-01-08
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