Invention Grant
- Patent Title: Semiconductor component and method
- Patent Title (中): 半导体元件及方法
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Application No.: US12261838Application Date: 2008-10-30
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Publication No.: US07791138B2Publication Date: 2010-09-07
- Inventor: Frank Pfirsch
- Applicant: Frank Pfirsch
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Dicke, Billig & Czaja, PLLC
- Priority: DE102007052202 20071030
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/94 ; H01L27/095

Abstract:
A semiconductor component and method of making a semiconductor component. One embodiment provides a first metallization structure electrically coupled to charge compensation zones via an ohmic contact and to drift zones via a Schottky contact. A second metallization structure, which is arranged opposite the first metallization structure, is electrically coupled to the charge compensation zones via a Schottky contact and to drift zones via an ohmic contact.
Public/Granted literature
- US20090108303A1 SEMICONDUCTOR COMPONENT AND METHOD Public/Granted day:2009-04-30
Information query
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