Invention Grant
US07791158B2 CMOS image sensor including an interlayer insulating layer and method of manufacturing the same
有权
包括层间绝缘层的CMOS图像传感器及其制造方法
- Patent Title: CMOS image sensor including an interlayer insulating layer and method of manufacturing the same
- Patent Title (中): 包括层间绝缘层的CMOS图像传感器及其制造方法
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Application No.: US11385958Application Date: 2006-03-21
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Publication No.: US07791158B2Publication Date: 2010-09-07
- Inventor: Hee-Geun Jeong , Jae-Seob Roh , Seok-Ha Lee
- Applicant: Hee-Geun Jeong , Jae-Seob Roh , Seok-Ha Lee
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2005-0030738 20050413; KR10-2005-0053014 20050620
- Main IPC: H01L31/0232
- IPC: H01L31/0232

Abstract:
Provided are a CMOS image sensor and a method of manufacturing the same. The CMOS image sensor includes a semiconductor substrate having photodiodes and transistors. An interlayer insulating layer is formed on the resultant structure having the photodiodes and transistors, and light blocking patterns are formed on the interlayer insulating layer to surround the peripheries of the photodiodes.
Public/Granted literature
- US20060231898A1 CMOS image sensor and method of manufacturing the same Public/Granted day:2006-10-19
Information query
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