A method for detecting a fault in semiconductor components in electrical machines, e.g., three-phase generators, used in the automotive field is described. The electrical machine is equipped with multiple windings, each having a phase terminal U, V, W. The electrical machine is checked by determining the voltage in one of its phase terminals U, V, W both during operation and at rest. The phase terminals of phase terminals U, V, W of the electrical machine that are not taken into account are checked for voltage dips with respect to a potential or are checked for the output currents.