Invention Grant
- Patent Title: Inspection apparatus
- Patent Title (中): 检验仪器
-
Application No.: US12333644Application Date: 2008-12-12
-
Publication No.: US07791362B2Publication Date: 2010-09-07
- Inventor: Junichi Hagihara
- Applicant: Junichi Hagihara
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-322865 20071214
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An inspection apparatus includes a movable mounting table having a temperature control device, an elevation drive unit for vertically moving the mounting table, a controller for controlling the elevation drive unit and a probe card having probes arranged above the mounting table. The elevation drive unit includes first and second driving shafts connected to each other through coupling members to drive the mounting table, a motor for driving the first and second driving shafts, and a torque detection unit for detecting a torque between the first and second driving shafts based on a contact load between the probes and the at least one device. The controller includes a torque controller for controlling the torque based on detection results of the torque detection unit when the probe card expands or contracts due to temperature variation.
Public/Granted literature
- US20090153170A1 INSPECTION APPARATUS Public/Granted day:2009-06-18
Information query