Invention Grant
- Patent Title: Reflective display device testing system, apparatus, and method
- Patent Title (中): 反光显示设备测试系统,设备和方法
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Application No.: US11753577Application Date: 2007-05-25
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Publication No.: US07791717B2Publication Date: 2010-09-07
- Inventor: Qing-Shan Cao , Wen-Bo Fa , Xu-Chen Mu , Jiang-Yong Zhou
- Applicant: Qing-Shan Cao , Wen-Bo Fa , Xu-Chen Mu , Jiang-Yong Zhou
- Applicant Address: unknown Shenzhen, Guangdong Province TW Pan Chiao, Taipei Hsien
- Assignee: Ensky Technology (Shenzhen) Co., Ltd.,Ensky Technology Co., Ltd.
- Current Assignee: Ensky Technology (Shenzhen) Co., Ltd.,Ensky Technology Co., Ltd.
- Current Assignee Address: unknown Shenzhen, Guangdong Province TW Pan Chiao, Taipei Hsien
- Agent Winston Hsu
- Priority: CN200610060793 20060526
- Main IPC: G01J1/00
- IPC: G01J1/00

Abstract:
A system for testing a reflective display device includes a testing apparatus and a computer. The testing apparatus includes one or more light emitters, one or more light detectors, an analog-to-digital converter (ADC) module, and a microcontroller unit (MCU). The light emitters are for projecting light onto a reflective display device located on the testing apparatus. The light detectors are for sensing reflected light from the reflective display device, and generating electricity according to a luminance of the reflected light. The ADC module is for receiving the electrical signals from the light detectors, and producing a digital output according to voltages of the electrical signals. The MCU is configured for reading the digital output of the ADC module. The computer is for processing the digital output and displaying results after processing.
Public/Granted literature
- US20070276615A1 REFLECTIVE DISPLAY DEVICE TESTING SYSTEM, APPARATUS, AND METHOD Public/Granted day:2007-11-29
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