Invention Grant
US07791719B1 Using a fixed-frequency oscillation to detect and measure scene inhomogeneity
有权
使用固定频率振荡来检测和测量场景不均匀性
- Patent Title: Using a fixed-frequency oscillation to detect and measure scene inhomogeneity
- Patent Title (中): 使用固定频率振荡来检测和测量场景不均匀性
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Application No.: US12013523Application Date: 2008-01-14
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Publication No.: US07791719B1Publication Date: 2010-09-07
- Inventor: Douglas Lent Cohen , David James Crain , Richard James Hertel
- Applicant: Douglas Lent Cohen , David James Crain , Richard James Hertel
- Applicant Address: US DE Wilmington
- Assignee: ITT Manufacturing Enterprises, Inc.
- Current Assignee: ITT Manufacturing Enterprises, Inc.
- Current Assignee Address: US DE Wilmington
- Agency: Ratner Prestia
- Main IPC: G01J1/56
- IPC: G01J1/56 ; G01P3/40

Abstract:
An optical system measures scene inhomogeneity. The system includes a mirror for receiving radiance of a field-of-view (FOV) of a scene, and reflecting a portion of the radiance to an optical detector. A controller is coupled to the mirror for changing the FOV. The optical detector provides a signal of the reflected portion of radiance of the scene. A processor determines scene inhomogeneity, based on amplitude of the signal provided from the optical detector. The controller is configured to modulate the FOV at a periodic interval, using a sinusoidal waveform, a pulse code modulated waveform, or a pseudo-random waveform.
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