Invention Grant
- Patent Title: Semiconductor memory device and operation method thereof
- Patent Title (中): 半导体存储器件及其操作方法
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Application No.: US12154937Application Date: 2008-05-28
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Publication No.: US07791963B2Publication Date: 2010-09-07
- Inventor: Beom-Ju Shin
- Applicant: Beom-Ju Shin
- Applicant Address: KR Kyoungki-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Kyoungki-do
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Priority: KR2008-0018763 20080229
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
Semiconductor memory device and operation method thereof includes an output enable signal generator configured to synchronize a read command to a data clock signal to generate an output enable signal according to a CAS latency, a sampling control signal generator configured to generate a sampling control signal that is activated during a period corresponding to an activation timing of the output enable signal and an end timing of data output, a read clock signal generator configured to sample the data clock signal in response to the sampling control signal to generate a read clock signal and a data output circuit configured to output data according to the read clock signal.
Public/Granted literature
- US20090219770A1 Semiconductor memory device and operation method thereof Public/Granted day:2009-09-03
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