Invention Grant
- Patent Title: Dynamic phase tracking using edge detection
- Patent Title (中): 使用边缘检测的动态相位跟踪
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Application No.: US10351590Application Date: 2003-01-27
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Publication No.: US07792235B2Publication Date: 2010-09-07
- Inventor: Sen-Jung Wei
- Applicant: Sen-Jung Wei
- Applicant Address: US CA San Jose
- Assignee: Integrated Device Technology, Inc.
- Current Assignee: Integrated Device Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Panitch, et al.
- Main IPC: H03D3/24
- IPC: H03D3/24

Abstract:
A phase-locked loop includes a sample selector configured to select a set of samples from an oversampled portion of a data signal, a dynamic phase decision control configured to indicate whether a predetermined number of edges is present in the set of samples, and a phase detector configured to determine a skew condition and a direction of the skew condition of the set of samples based on the indication of the dynamic phase decision control. The phase detector is configured to determine a skew condition based on a relation between a threshold and a number of skew errors detected in the set of samples. A value of the threshold is selected according to the indication of the dynamic phase decision control. A lower value of the threshold is selected according to an indication of the dynamic phase decision control that only one edge is present in the set of samples. Furthermore, the dynamic phase decision control includes an edge detector configured to detect edges in the set of samples, and an edge counter configured to indicate the detection of the predetermined number of edges in the set of samples. Methods of determining a skew condition and a direction of the skew condition, and methods of determining whether a predetermined number of edges is present in the set of samples, are implemented using these elements.
Public/Granted literature
- US20040001567A1 Dynamic phase tracking using edge detection Public/Granted day:2004-01-01
Information query
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