Invention Grant
- Patent Title: Method of measuring amount of eccentricity
- Patent Title (中): 测量偏心量的方法
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Application No.: US12732836Application Date: 2010-03-26
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Publication No.: US07792366B1Publication Date: 2010-09-07
- Inventor: Zongtao Ge , Kenichi Takahashi
- Applicant: Zongtao Ge , Kenichi Takahashi
- Applicant Address: JP Saitama-shi
- Assignee: Fujinon Corporation
- Current Assignee: Fujinon Corporation
- Current Assignee Address: JP Saitama-shi
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JPP2009-080213 20090327
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G01B9/00

Abstract:
An optical element to be measured is irradiated with the light which has passed through an indicator, thereby to form an indicator image on an image pick-up surface. Maximum peak coordinates are specified and stored as a position of the indicator image relating to the first surface. Whether the second largest peak may be specified or not is determined. In case that this result is NO, the maximum peak indicator image is deleted, and maximum peak coordinates are specified again and stored as a position of the indicator image relating to the second surface.
Public/Granted literature
- US20100245804A1 METHOD OF MEASURING AMOUNT OF ECCENTRICITY Public/Granted day:2010-09-30
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