Invention Grant
US07793173B2 Efficient memory product for test and soft repair of SRAM with redundancy
失效
高效的内存产品，用于冗余测试和软修复SRAM
- Patent Title: Efficient memory product for test and soft repair of SRAM with redundancy
- Patent Title (中): 高效的内存产品，用于冗余测试和软修复SRAM
-
Application No.: US12164869Application Date: 2008-06-30
-
Publication No.: US07793173B2Publication Date: 2010-09-07
- Inventor: Tom Y. Chang , William V. Huott , Thomas J. Knips , Donald W. Plass
- Applicant: Tom Y. Chang , William V. Huott , Thomas J. Knips , Donald W. Plass
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent William A. Kinnaman, Jr.
- Main IPC: G11C29/00
- IPC: G11C29/00
Abstract:
Memory array built in self testing utilizing including a simple data history table. The table is used to track failing locations observed during any level of assembly test of processor or logic semiconductor chips where the chips contain SRAM macros with redundant elements for failure relief.
Public/Granted literature
- US20080263417A1 Efficient Memory Product for Test and Soft Repair of SRAM with Redundancy Public/Granted day:2008-10-23
Information query
