Invention Grant
- Patent Title: Ultrasonic flaw detection method and ultrasonic flaw detection device
- Patent Title (中): 超声波探伤法和超声波探伤仪
-
Application No.: US11918327Application Date: 2006-06-12
-
Publication No.: US07793546B2Publication Date: 2010-09-14
- Inventor: Hiroaki Katsura , Yoichiro Ueda , Kazuya Ushirokawa
- Applicant: Hiroaki Katsura , Yoichiro Ueda , Kazuya Ushirokawa
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Steptoe & Johnson LLP
- Priority: JP2005-201016 20050711
- International Application: PCT/JP2005/311737 WO 20060612
- International Announcement: WO2007/007500 WO 20070118
- Main IPC: G01N29/28
- IPC: G01N29/28

Abstract:
An ultrasonic transmission medium is received in a medium container, and an opening of the container is sealed by a polymer membrane. An inspection object is received in an inspection object receiving container body that is separate from the medium container and whose opening is formed opposite the polymer membrane of the medium container. The opening of the inspection object receiving container body is covered by the polymer membrane of the medium container, and a measurement environment space formed by a frame body, the polymer membrane, and the inspection object is reduced in pressure to cause the polymer membrane to be in intimate contact with the inspection object. Then, flaw detection is performed by emitting and applying an ultrasonic wave from an ultrasonic probe to the inspection object via the ultrasonic transmission medium and the polymer membrane.
Public/Granted literature
- US20090301201A1 Ultrasonic Flaw Detection Method and Ultrasonic Flaw Detection Device Public/Granted day:2009-12-10
Information query