Invention Grant
- Patent Title: Method of manufacturing a semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US10539549Application Date: 2003-12-16
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Publication No.: US07794540B2Publication Date: 2010-09-14
- Inventor: Petrus Hubertus Cornelis Magnee , Johannes Josephus Theodorus Marinus Donkers , Xiaoping Shi
- Applicant: Petrus Hubertus Cornelis Magnee , Johannes Josephus Theodorus Marinus Donkers , Xiaoping Shi
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP02080509 20021220
- International Application: PCT/IB03/06017 WO 20031216
- International Announcement: WO2004/057654 WO 20040708
- Main IPC: C30B25/00
- IPC: C30B25/00 ; C30B28/12 ; H01L21/00 ; H01L27/06

Abstract:
Method of manufacturing a semiconductor device, in which on a region of silicon oxide (5) situated next to a region of monocrystalline silicon (4) at the surface (3) of a semiconductor body (1), a non-monocrystalline auxiliary layer (8) is formed. The auxiliary layer is formed in two steps. In the first step, the silicon body is heated in an atmosphere comprising a gaseous arsenic compound; in the second step it is heated in an atmosphere comprising a gaseous silicon compound instead of said arsenic compound. Thus, the regions of silicon oxide are provided with an amorphous or polycrystalline silicon seed layer in a self-aligned manner.
Public/Granted literature
- US20060148257A1 Method of manufacturing a semiconductor device Public/Granted day:2006-07-06
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