Invention Grant
- Patent Title: Pattern decomposition method for double exposure
- Patent Title (中): 双重曝光图案分解方法
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Application No.: US11754811Application Date: 2007-05-29
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Publication No.: US07794920B2Publication Date: 2010-09-14
- Inventor: Jae Seung Choi
- Applicant: Jae Seung Choi
- Applicant Address: KR
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR
- Agency: Marshall, Gerstein & Borun LLP
- Priority: KR10-2006-0068524 20060721
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
A pattern decomposition method capable of achieving patterns with a complicated layout by double exposure. The pattern decomposition method for decomposing a target pattern which includes first patterns having repeated lines and spaces and second patterns disposed between the first patterns and having a predetermined size into patterns for first exposure and patterns for second exposure, comprises decomposing the first patterns into a pattern for first exposure and a pattern for second exposure, decomposing the second patterns into a pattern for first exposure and a pattern for second exposure, and respectively merging the pattern for first exposure or the pattern for second exposure of the first patterns with the pattern for first exposure or the pattern for second exposure of the second patterns.
Public/Granted literature
- US20080020326A1 Pattern Decomposition Method For Double Exposure Public/Granted day:2008-01-24
Information query
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