Invention Grant
- Patent Title: Probe, probe set, probe carrier, and testing method
- Patent Title (中): 探头,探针架,探头载体和测试方法
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Application No.: US12120164Application Date: 2008-05-13
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Publication No.: US07795418B2Publication Date: 2010-09-14
- Inventor: Nobuhiro Tomatsu , Toshifumi Fukui , Nobuyoshi Shimizu , Atsushi Takayanagi
- Applicant: Nobuhiro Tomatsu , Toshifumi Fukui , Nobuyoshi Shimizu , Atsushi Takayanagi
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2007-128626 20070514
- Main IPC: C07H21/04
- IPC: C07H21/04 ; C12Q1/68

Abstract:
A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.
Public/Granted literature
- US20080293064A1 PROBE, PROBE SET, PROBE CARRIER, AND TESTING METHOD Public/Granted day:2008-11-27
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