Invention Grant
- Patent Title: Finned memory cells
- Patent Title (中): 翅片存储单元
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Application No.: US12257100Application Date: 2008-10-23
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Publication No.: US07795664B2Publication Date: 2010-09-14
- Inventor: Seiichi Aritome
- Applicant: Seiichi Aritome
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L21/8238

Abstract:
For an embodiment, a memory array has a plurality fins protruding from a substrate. A tunnel dielectric layer overlies the fins. A plurality floating gates overlie the tunnel dielectric layer, and the floating gates correspond one-to-one with the fins protruding from the substrate. An intergate dielectric layer overlies the floating gates. A control gate layer overlies the intergate dielectric layer. Each fin includes an upper surface rounded by isotropic etching.
Public/Granted literature
- US20090045449A1 FINNED MEMORY CELLS Public/Granted day:2009-02-19
Information query
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