Invention Grant
US07795666B2 Semiconductor time switch suitable for embedding in NAND flash memory device
有权
半导体时间开关适用于嵌入NAND闪存器件
- Patent Title: Semiconductor time switch suitable for embedding in NAND flash memory device
- Patent Title (中): 半导体时间开关适用于嵌入NAND闪存器件
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Application No.: US12233168Application Date: 2008-09-18
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Publication No.: US07795666B2Publication Date: 2010-09-14
- Inventor: Hiroshi Watanabe
- Applicant: Hiroshi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-051056 20080229
- Main IPC: H01L29/788
- IPC: H01L29/788

Abstract:
A semiconductor time switch includes a cell portion and an electron booster. The cell portion contains parallel linear semiconductor layers provided on a substrate as active areas, first and second linear conductor layers alternately formed on the linear semiconductor layers through a gate insulating film as control gates and extending so as to cross the linear semiconductor layers, and floating gates inserted into respective intersections of the linear semiconductor layers and the first linear conductor layers, and coupled to the first linear conductor layers through an inter-gate insulating film. The electron booster is provided on the substrate and includes a MOS transistor having a booster gate electrode connected to the second linear conductor layers. Both ends of the linear semiconductor layers are connected to first and second I/O terminals of the switch, respectively.
Public/Granted literature
- US20090218613A1 SEMICONDUCTOR TIME SWITCH SUITABLE FOR EMBEDDING IN NAND FLASH MEMORY DEVICE Public/Granted day:2009-09-03
Information query
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