Invention Grant
- Patent Title: Semiconductor device including a germanium silicide film on a selective epitaxial layer
- Patent Title (中): 半导体器件包括选择性外延层上的硅化锗膜
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Application No.: US11878294Application Date: 2007-07-23
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Publication No.: US07795689B2Publication Date: 2010-09-14
- Inventor: Keizo Kawakita
- Applicant: Keizo Kawakita
- Applicant Address: JP Chuo-ku, Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Chuo-ku, Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2006-202143 20060725
- Main IPC: H01L21/8238
- IPC: H01L21/8238 ; H01L29/43

Abstract:
A process for manufacturing a semiconductor device includes: forming first contact holes in a dielectric film for a PMOS transistor; depositing germanium on the source/drain regions of the PMOS transistor exposed from the first contact holes; heat treating the germanium with silicon in the source/drain regions of the PMOS transistor to form a germanium silicide film; forming second contact holes in the dielectric film for the source/drain regions of the NMOS transistor; and forming contact plugs in the first and second contact holes.
Public/Granted literature
- US20080023772A1 Semiconductor device including a germanium silicide film on a selective epitaxial layer Public/Granted day:2008-01-31
Information query
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