Invention Grant
- Patent Title: Optically isolated current monitoring for ionization systems
- Patent Title (中): 电离系统光电隔离电流监测
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Application No.: US11682762Application Date: 2007-03-06
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Publication No.: US07795885B2Publication Date: 2010-09-14
- Inventor: John A. Gorczyca , King K. Miller
- Applicant: John A. Gorczyca , King K. Miller
- Applicant Address: US IL Glenview
- Assignee: Illinois Tool Works Inc.
- Current Assignee: Illinois Tool Works Inc.
- Current Assignee Address: US IL Glenview
- Agency: Panitch Schwarze Belisario & Nadel LLP
- Main IPC: G01R31/302
- IPC: G01R31/302

Abstract:
Current is measured in an ionization device that includes a high voltage supply, and an emitter electrically coupled to the HV supply. An opto-isolator is provided that includes a light source and a light detector. The light source has a current flowing through it. The light source is electrically coupled to the emitter. The output of the light detector is measured. The output of the light detector is related to the current flowing through the light source.
Public/Granted literature
- US20080218737A1 OPTICALLY ISOLATED CURRENT MONITORING FOR IONIZATION SYSTEMS Public/Granted day:2008-09-11
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