Invention Grant
- Patent Title: Tester with low signal attenuation
- Patent Title (中): 测试仪具有低信号衰减
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Application No.: US12534868Application Date: 2009-08-04
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Publication No.: US07795891B2Publication Date: 2010-09-14
- Inventor: Chia-Wei Wu
- Applicant: Chia-Wei Wu
- Applicant Address: TW Taoyuan
- Assignee: Nanya Technology Corporation
- Current Assignee: Nanya Technology Corporation
- Current Assignee Address: TW Taoyuan
- Agency: Jianq Chyun IP Office
- Priority: TW96110718A 20070328
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A tester with low signal attenuation and suitable for measuring an electrical characteristic of a subject to be tested includes a circuit board and a first probe. The circuit board has a first surface and a second surface respectively having a first signal transmission line and a second signal transmission line. The first probe has a contact end contacting the subject to be tested and a first signal end and a second signal end respectively connecting the first signal transmission line and the second signal transmission line. The first probe receives a testing signal from the first signal transmission line through the first signal end and transmits the testing signal from the contact end to the subject to be tested, such that the subject to be tested generates a response signal, and the first probe transmits the response signal to the second signal transmission line through the second signal end.
Public/Granted literature
- US20090289649A1 TESTER WITH LOW SIGNAL ATTENUATION Public/Granted day:2009-11-26
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