Invention Grant
- Patent Title: On-chip frequency response measurement
- Patent Title (中): 片上频率响应测量
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Application No.: US11844393Application Date: 2007-08-24
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Publication No.: US07797131B2Publication Date: 2010-09-14
- Inventor: Deepak K. Singh , Francois Ibrahim Atallah , David John Seman
- Applicant: Deepak K. Singh , Francois Ibrahim Atallah , David John Seman
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Thomas E. Tyson; Joseelyn G. Cockburn; Cynthia Seal
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/40

Abstract:
A method and circuit are provided for measuring frequency response performance of an integrated circuit by providing a pulse having a rising edge and a falling edge where the pulse is provided to a plurality of serially connected components. The number of these components which have propagated the leading edge of the pulse before the occurrence of the falling edge provide a numeric indication of the circuit's frequency response and performance.
Public/Granted literature
- US20090055122A1 On-Chip Frequency Response Measurement Public/Granted day:2009-02-26
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