Invention Grant
- Patent Title: Optical masks and methods for measuring aberration of a beam
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Application No.: US12686093Application Date: 2010-01-12
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Publication No.: US07799490B2Publication Date: 2010-09-21
- Inventor: Chan Hwang , Suk-Joo Lee , Han-Ku Cho , Sang-Gyun Woo
- Applicant: Chan Hwang , Suk-Joo Lee , Han-Ku Cho , Sang-Gyun Woo
- Applicant Address: KR Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Myers Bigel Sibley & Sajovec, PA
- Priority: KR10-2004-0109830 20041221
- Main IPC: G03F1/00
- IPC: G03F1/00

Abstract:
An optical mask for use with an exposure beam includes a mask substrate adapted to be placed on a traveling path of the exposure beam. A reference pattern is formed on the mask substrate. The reference pattern is adapted to direct the exposure beam to travel in a predetermined reference direction. A comparative pattern is formed on the mask substrate. The comparative pattern is adapted to direct the exposure beam to travel in a direction inclined at a predetermined angle with respect to the reference direction.
Public/Granted literature
- US20100112466A1 OPTICAL MASKS AND METHODS FOR MEASURING ABERRATION OF A BEAM Public/Granted day:2010-05-06
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