Invention Grant
- Patent Title: Method for manufacturing a semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US11183806Application Date: 2005-07-19
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Publication No.: US07799693B2Publication Date: 2010-09-21
- Inventor: Eiichi Soda
- Applicant: Eiichi Soda
- Applicant Address: JP Kanagawa
- Assignee: NEC Electronics Corporation
- Current Assignee: NEC Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2004-216152 20040723
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/461

Abstract:
Method for manufacturing a semiconductor device including a semiconductor substrate, an element formed on the substrate, and an insulating film formed on the element, includes: (a) forming a first conductive layer (b) forming a first insulating film on the upper portion of the first conductive layer; (c) forming a second insulating film with a porous structure on the first insulating film; (d) forming a third insulating film different from the second insulating film on the second insulating film; (e) forming a via hole in the second and third insulating film by dry etching of the third insulating films; (f) removing a part of the first insulating film such that the surface of the first conductive layer is exposed at the bottom of the via hole and (g) forming a second conductive material film layer so as to fill the via hole.
Public/Granted literature
- US20060019491A1 Method for manufacturing a semiconductor device Public/Granted day:2006-01-26
Information query
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