Invention Grant
- Patent Title: Probe sheet and electrical connecting apparatus
- Patent Title (中): 探头片和电气连接装置
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Application No.: US12297215Application Date: 2007-03-27
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Publication No.: US07800001B2Publication Date: 2010-09-21
- Inventor: Kazuhito Hamada , Takashi Akiniwa , Satoshi Narita
- Applicant: Kazuhito Hamada , Takashi Akiniwa , Satoshi Narita
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee Address: JP Tokyo
- Agency: Graybeal Jackson LLP
- Agent Bryan A. Santarelli
- Priority: JP2006-111813 20060414
- International Application: PCT/JP2007/057362 WO 20070327
- International Announcement: WO2007/119638 WO 20071025
- Main IPC: H01L23/495
- IPC: H01L23/495

Abstract:
An embodiment of a probe sheet enabling to restrict misalignment of the posture of each contactor accurately positioned on a probe sheet main body caused by deformation of the probe sheet main body is provided. The probe sheet comprises a probe sheet main body having a flexible insulating synthetic resin film and conductive paths buried in the synthetic resin film and a plurality of contactors formed to be protruded from a contactor area on one surface of the probe sheet main body and connected to the conductive paths. In the probe sheet main body is buried a plate-shaped member having higher rigidity than that of the synthetic resin film and restricting deformation of the contactor area.
Public/Granted literature
- US20090264025A1 PROBE SHEET AND ELECTRICAL CONNECTING APPARATUS Public/Granted day:2009-10-22
Information query
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