Invention Grant
US07800040B2 Method for growing a back surface contact on an imaging detector used in conjunction with back illumination 有权
在与背照射结合使用的成像检测器上生长背面接触的方法

Method for growing a back surface contact on an imaging detector used in conjunction with back illumination
Abstract:
A method is provided for growing a back surface contact on an imaging detector used in conjunction with back illumination. In operation, an imaging detector is provided. Additionally, a back surface contact (e.g. a delta-doped layer, etc.) is grown on the imaging detector utilizing a process that is performed at a temperature less than 450 degrees Celsius.
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