Invention Grant
- Patent Title: Specimen holder for electron microscope
- Patent Title (中): 电子显微镜样品支架
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Application No.: US11964392Application Date: 2007-12-26
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Publication No.: US07800077B2Publication Date: 2010-09-21
- Inventor: Koji Moriya
- Applicant: Koji Moriya
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2006-349195 20061226
- Main IPC: H01J37/20
- IPC: H01J37/20 ; G01N3/02

Abstract:
The present invention provides a specimen holder for use with an electron microscope. The specimen holder has a retainer mounted at the front end of the body of the specimen holder. The retainer has a plate member provided with a hole around its front end. The hole provides a reference in securing the whole specimen for a desired field of view. A circular groove is formed in the plate member and used to place the specimen in position. Any members lying perpendicularly to the tilted axis at the position of the specimen are cut out.
Public/Granted literature
- US20090014664A1 Specimen Holder for Electron Microscope Public/Granted day:2009-01-15
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