Nonvolatile semiconductor memory device with twin-well

Invention Grant

US07800154B2 Nonvolatile semiconductor memory device with twin-well 有权

Title translation: 具有双阱的非易失性半导体存储器件

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Patent Title: Nonvolatile semiconductor memory device with twin-well
Patent Title (中): 具有双阱的非易失性半导体存储器件
Application No.: US11031036

Application Date: 2005-01-10
Publication No.: US07800154B2

Publication Date: 2010-09-21
Inventor: Mitsuhiro Noguchi , Minori Kajimoto
Applicant: Mitsuhiro Noguchi , Minori Kajimoto
Applicant Address: JP Tokyo
Assignee: Kabushiki Kaisha Toshiba
Current Assignee: Kabushiki Kaisha Toshiba
Current Assignee Address: JP Tokyo
Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
Priority: JP2004-316704 20041029
Main IPC: H01L29/94
IPC: H01L29/94

Nonvolatile semiconductor memory device with twin-well

Abstract:

A nonvolatile semiconductor memory device includes a first well of a first conductivity type, which is formed in a semiconductor substrate of the first conductivity type, a plurality of memory cell transistors that are formed in the first well, a second well of a second conductivity type, which includes a first part that surrounds a side region of the first well and a second part that surrounds a lower region of the first well, and electrically isolates the first well from the semiconductor substrate, and a third well of the second conductivity type, which is formed in the semiconductor substrate. The third well has a less depth than the second part of the second well.

Abstract(Chinese):

非易失性半导体存储器件包括形成在第一导电类型的半导体衬底中的第一导电类型的第一阱，形成在第一阱中的多个存储单元晶体管，第二导电类型的第二阱，其包括围绕所述第一阱的侧部区域的第一部分和围绕所述第一阱的下部区域的第二部分，并且将所述第一阱与所述半导体衬底以及所述第二导电类型的第三阱电隔离，其形成在半导体衬底中。第三井具有比第二井的第二部分更少的深度。

Public/Granted literature

US20060091470A1 Nonvolatile semiconductor memory device with twin-well Public/Granted day:2006-05-04

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L29/00	专门适用于整流、放大、振荡或切换，并具有至少一个电位跃变势垒或表面势垒的半导体器件；具有至少一个电位跃变势垒或表面势垒，例如PN结耗尽层或载流子集结层的电容器或电阻器；半导体本体或其电极的零部件（H01L31/00至H01L47/00，H01L51/05优先；除半导体或其电极之外的零部件入H01L23/00；由在一个共用衬底内或其上形成的多个固态组件组成的器件入H01L27/00）
H01L29/66	.按半导体器件的类型区分的
H01L29/86	..只能通过对一个或多个通有待整流，放大、振荡或切换的电流的电极供给电流的变化或施加电位的变化方可进行控制的（H01L29/96优先）
H01L29/92	...有电位跃变势垒或表面势垒的电容器
H01L29/94	....金属—绝缘体—半导体，例如MOS