Invention Grant
US07800382B2 System for testing an integrated circuit of a device and its method of use
有权
用于测试设备集成电路的系统及其使用方法
- Patent Title: System for testing an integrated circuit of a device and its method of use
- Patent Title (中): 用于测试设备集成电路的系统及其使用方法
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Application No.: US11960453Application Date: 2007-12-19
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Publication No.: US07800382B2Publication Date: 2010-09-21
- Inventor: Scott E. Lindsey , Jovan Jovanovic , David S. Hendrickson , Donald P. Richmond, II
- Applicant: Scott E. Lindsey , Jovan Jovanovic , David S. Hendrickson , Donald P. Richmond, II
- Applicant Address: US CA Fremont
- Assignee: AEHR Test Ststems
- Current Assignee: AEHR Test Ststems
- Current Assignee Address: US CA Fremont
- Agency: Sonnenschein, Nath & Rosenthal LLP
- Agent Stephen M. De Klerk
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.
Public/Granted literature
- US20090160468A1 SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE Public/Granted day:2009-06-25
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