Invention Grant
- Patent Title: Integrated circuit having built-in self-test features
- Patent Title (中): 集成电路具有内置的自检功能
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Application No.: US11777406Application Date: 2007-07-13
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Publication No.: US07800389B2Publication Date: 2010-09-21
- Inventor: Andreas P. Friedrich , Andrea Foletto , P. Karl Scheller , Paul David
- Applicant: Andreas P. Friedrich , Andrea Foletto , P. Karl Scheller , Paul David
- Applicant Address: US MA Worcester
- Assignee: Allegro Microsystems, Inc.
- Current Assignee: Allegro Microsystems, Inc.
- Current Assignee Address: US MA Worcester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
An integrated circuit includes a sensor for providing a sensor output signal and a diagnostic circuit coupled to the sensor for providing a self-diagnostic signal. The self-diagnostic signal comprises the sensor output signal during a first time duration and an inverted sensor output signal during a second different time duration.
Public/Granted literature
- US20090019330A1 INTEGRATED CIRCUIT HAVING BUILT-IN SELF-TEST FEATURES Public/Granted day:2009-01-15
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