A solid-state pixel structure or pixel array includes integrated exposure control provided within the pixel structure and/or pixel array. Including exposure control within the pixel structure and/or array allows optimal exposure to be achieved in real time. Optimal exposure is achieved by measuring the response of pixel structures to received electromagnetic radiation, and using the response information, in conjunction with knowledge regarding the pixel structure capabilities and photometric thresholds, to determine when the pixel structure is operating optimally. Tight control of the exposure of the pixel structure to the electromagnetic radiation allows the pixel structure to operate optimally in order to provide an optimal captured image.