Invention Grant
- Patent Title: Ferroelectric random access memory apparatus and method of driving the same
- Patent Title (中): 铁电随机存取存储装置及其驱动方法
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Application No.: US12228590Application Date: 2008-08-14
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Publication No.: US07800931B2Publication Date: 2010-09-21
- Inventor: Byung-Jun Min , Kang-Woon Lee , Han-Joo Lee , Byung-Gil Jeon
- Applicant: Byung-Jun Min , Kang-Woon Lee , Han-Joo Lee , Byung-Gil Jeon
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Mills & Onello LLP
- Priority: KR10-2007-0085181 20070823
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
In a ferroelectric random access memory device that can allow a stable burst read operation and a method of driving a ferroelectric random access memory device thereof, the ferroelectric random access memory device comprises first and second memory cell sections, each comprising a plurality of ferroelectric memory cells, and a read circuit that sequentially performs a burst read operation on the first and second memory cell sections such that a read operation of the first memory cell section partially overlaps a read operation of the second memory cell section. When a chip is disabled during the read operation of the first memory cell section, the read circuit writes back data in the second memory cell section in response to the extent to which the read operation of the second memory cell section has been performed.
Public/Granted literature
- US20090052224A1 Ferroelectric random access memory apparatus and method of driving the same Public/Granted day:2009-02-26
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