Invention Grant
US07800933B2 Method for using a memory cell comprising switchable semiconductor memory element with trimmable resistance
有权
一种用于使用具有可调整电阻的可切换半导体存储元件的存储单元的方法
- Patent Title: Method for using a memory cell comprising switchable semiconductor memory element with trimmable resistance
- Patent Title (中): 一种用于使用具有可调整电阻的可切换半导体存储元件的存储单元的方法
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Application No.: US11496986Application Date: 2006-07-31
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Publication No.: US07800933B2Publication Date: 2010-09-21
- Inventor: Tanmay Kumar , S. Brad Herner , Roy E Scheuerlein , Christopher J Petti
- Applicant: Tanmay Kumar , S. Brad Herner , Roy E Scheuerlein , Christopher J Petti
- Applicant Address: US CA Milpitas
- Assignee: Sandisk 3D LLC
- Current Assignee: Sandisk 3D LLC
- Current Assignee Address: US CA Milpitas
- Agency: The Marbury Law Group PLLC
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/36

Abstract:
A nonvolatile memory cell comprising a diode formed of semiconductor material can store memory states by changing the resistance of the semiconductor material by application of a set pulse (decreasing resistance) or a reset pulse (increasing resistance.) In preferred embodiments, set pulses are applied with the diode under forward bias, while reset pulses are applied with the diode in reverse bias. By switching resistivity of the semiconductor material of the diode, a memory cell can be either one-time programmable or rewriteable, and can achieve two, three, four, or more distinct data states.
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