Invention Grant
- Patent Title: Apparatus and method for measuring signal quality
- Patent Title (中): 用于测量信号质量的装置和方法
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Application No.: US10931254Application Date: 2004-09-01
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Publication No.: US07801005B2Publication Date: 2010-09-21
- Inventor: Hyun-soo Park , Jae-seong Shim , Jae-wook Lee , Jung-hyun Lee , Eun-jin Ryu , Eing-seob Cho
- Applicant: Hyun-soo Park , Jae-seong Shim , Jae-wook Lee , Jung-hyun Lee , Eun-jin Ryu , Eing-seob Cho
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2003-0064158 20030916
- Main IPC: G11B7/00
- IPC: G11B7/00

Abstract:
An apparatus and method for measuring the quality of a signal on an optical disc based on level information of a viterbi decoder are provided. The signal quality measuring apparatus includes: a binary unit that generates binary signals from input RF signals; a channel identifier that receives the input RF signals and the binary signals output from the binary unit and outputs reference level values corresponding to the binary signals; and an information calculator that receives the reference level values and detects a signal quality value.
Public/Granted literature
- US20050083822A1 Apparatus and method for measuring signal quality Public/Granted day:2005-04-21
Information query
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