Invention Grant
US07801259B2 Frequency detecting circuit and method, and semiconductor apparatus including frequency detecting circuit
有权
频率检测电路和方法,以及包括频率检测电路的半导体装置
- Patent Title: Frequency detecting circuit and method, and semiconductor apparatus including frequency detecting circuit
- Patent Title (中): 频率检测电路和方法,以及包括频率检测电路的半导体装置
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Application No.: US11507771Application Date: 2006-08-22
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Publication No.: US07801259B2Publication Date: 2010-09-21
- Inventor: Hyuk-Jun Sung , Ki-Bum Nam
- Applicant: Hyuk-Jun Sung , Ki-Bum Nam
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2005-0078977 20050826
- Main IPC: H04L7/04
- IPC: H04L7/04

Abstract:
A frequency detecting circuit and method and a semiconductor apparatus including the frequency detecting circuit, in which the frequency detecting circuit includes an edge detecting circuit, a clock signal generating circuit, and a determination circuit. The edge detecting circuit detects an edge of an input clock signal. The clock signal generating circuit generates a selection clock signal, which is a periodic pulse signal, in response to the detected edge. The determination circuit generates a frequency detection signal based on the number of occurrences of the selection clock signal in a period of the clock signal. The semiconductor apparatus includes the above-described frequency detecting circuit and a processor resetting the semiconductor apparatus in response to the frequency detection signal. Since a frequency is detected every half period, that is every high/low level period, of the clock signal in a digital manner, the reliability and the accuracy of frequency detection is improved.
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