Invention Grant
US07801264B2 Method for calibrating a dual -spectral computed tomography (CT) system
有权
校准双光谱计算机断层摄影(CT)系统的方法
- Patent Title: Method for calibrating a dual -spectral computed tomography (CT) system
- Patent Title (中): 校准双光谱计算机断层摄影(CT)系统的方法
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Application No.: US11959709Application Date: 2007-12-19
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Publication No.: US07801264B2Publication Date: 2010-09-21
- Inventor: Xiaoye Wu , James Walter Leblanc , Paavana Sainath
- Applicant: Xiaoye Wu , James Walter Leblanc , Paavana Sainath
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jason K. Klindtworth
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
A method for calibrating and reconstructing material density images in a dual-spectral computed tomography (CT) system 100 is disclosed. An X-ray source in the CT system 100 emits a first X-ray spectrum and a second X-ray spectrum towards an object. The method includes computing calibration coefficients by using projection data from the object for the two X-ray spectra and by linearizing at least two basis materials such as bone and water simultaneously. Further, basis materials decomposition coefficients for the at least two basis materials are computed by linearizing the basis materials individually. Correction values for the projection data and for the basis materials are then computed by using the basis materials decomposition coefficients and the calibration coefficients. The computed correction values are used in reconstructing material density images for the basis materials.
Public/Granted literature
- US20090161814A1 METHOD FOR CALIBRATING A DUAL -SPECTRAL COMPUTED TOMOGRAPHY (CT) SYSTEM Public/Granted day:2009-06-25
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