Invention Grant
US07801588B2 X-ray diagnostic imaging system and X-ray diagnostic imaging method
有权
X线诊断成像系统和X线诊断成像方法
- Patent Title: X-ray diagnostic imaging system and X-ray diagnostic imaging method
- Patent Title (中): X线诊断成像系统和X线诊断成像方法
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Application No.: US11156587Application Date: 2005-06-21
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Publication No.: US07801588B2Publication Date: 2010-09-21
- Inventor: Naoki Yamada
- Applicant: Naoki Yamada
- Applicant Address: JP Tokyo JP Otawara-shi
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- Current Assignee Address: JP Tokyo JP Otawara-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2004-184089 20040622; JP2005-169129 20050609
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
An X-ray diagnostic imaging method, comprises the steps of radiographing the predetermined area so that an image data of a first contrast image is acquired when a timing of an acquired start of the first contrast image comes, after an injection of the contrast medium into the affected part, and radiographing the predetermined area so that image data of a second contrast image is acquired when a timing of an acquired start of the second contrast image comes, after the image data of the first contrast image is acquired.
Public/Granted literature
- US20050283066A1 X-ray diagnostic imaging system and X-ray diagnostic imaging method Public/Granted day:2005-12-22
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