Invention Grant
- Patent Title: Testing system and testing method thereof
- Patent Title (中): 测试系统及其测试方法
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Application No.: US11767002Application Date: 2007-06-22
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Publication No.: US07802143B2Publication Date: 2010-09-21
- Inventor: Chao-Hung Wei , Hong Shan , Tie-Shan Jia
- Applicant: Chao-Hung Wei , Hong Shan , Tie-Shan Jia
- Applicant Address: CN ShenZhen, Guangdong Province HK Kowloon
- Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee Address: CN ShenZhen, Guangdong Province HK Kowloon
- Agent Jeffrey T. Knapp
- Priority: CN200610062729 20060922
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A present testing system (100) for testing electronic products is provided. The testing system includes a processor (10), a preliminary testing apparatus (20), and a final testing apparatus (30). The processor includes an encoding module (15) for generating product codes corresponding to the respective electronic products. The preliminary testing apparatus includes a data acquisition device (22) and a marking device (26). The data acquisition device tests the electronic products, acquires preliminary test data of the electronic products, and transmits the preliminary test data to the processor. The marking device marks the product codes onto the corresponding electronic products. The final testing apparatus includes a read device (32) for reading the product codes marked onto the electronic products and transmitting the product codes to the processor. The processor locates the corresponding preliminary testing data of the electronic products according to the product codes transmitted by the read device.
Public/Granted literature
- US20080077821A1 TESTING SYSTEM AND TESTING METHOD THEREOF Public/Granted day:2008-03-27
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