Invention Grant
- Patent Title: Enhanced logic built-in self-test module and method of online system testing employing the same
- Patent Title (中): 增强型逻辑内置自检模块和在线系统测试方法
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Application No.: US12170030Application Date: 2008-07-09
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Publication No.: US07802159B1Publication Date: 2010-09-21
- Inventor: Sreejit Chakravarty , Narendra Devta-Prasanna , Fan Yang
- Applicant: Sreejit Chakravarty , Narendra Devta-Prasanna , Fan Yang
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A logic built-in self-test (LBIST) module and a method of online system testing. In one embodiment, the LBIST module includes: (1) first and second data sources selectable to provide alternative respective first and second data to at least one scan chain and (2) a scan clock modifier associated with the first and second data sources and configured to drive the at least one scan chain with a selectively aperiodic modified scan clock signal.
Information query
