Invention Grant
- Patent Title: Methods and apparatuses for timing analysis of electronics circuits
- Patent Title (中): 电子电路定时分析方法和装置
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Application No.: US11635371Application Date: 2006-12-07
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Publication No.: US07802214B2Publication Date: 2010-09-21
- Inventor: Jens Bargfrede , Michael Mirbeth , Stefan Bergler , Alfred Lang
- Applicant: Jens Bargfrede , Michael Mirbeth , Stefan Bergler , Alfred Lang
- Applicant Address: DE Munich
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Munich
- Agency: Brinks Hofer Gilson & Lione
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
Methods and apparatuses for performing timing analyses of an electronic circuit are provided. Waveforms of signals in the circuit are determined, and timing checks are performed based on these waveforms.
Public/Granted literature
- US20080141199A1 Methods and apparatuses for timing analysis of electronics circuits Public/Granted day:2008-06-12
Information query
