Invention Grant
- Patent Title: Thermal processing apparatus
- Patent Title (中): 热处理设备
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Application No.: US11617183Application Date: 2006-12-28
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Publication No.: US07802986B2Publication Date: 2010-09-28
- Inventor: Kazuhiko Ooshima , Shigeki Aoki
- Applicant: Kazuhiko Ooshima , Shigeki Aoki
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2006-008839 20060117
- Main IPC: F27D1/18
- IPC: F27D1/18

Abstract:
A thermal processing apparatus for thermally processing a substrate in a processing chamber includes a heating plate for mounting and thermally processing the substrate thereon, and a lid body covering the heating plate from above to constitute a portion of the processing chamber. The lid body has a ceiling plate and a peripheral side portion vertically provided at a peripheral end portion of the ceiling plate. The ceiling plate is provided with a supply port for supplying a gas into the processing chamber, and a side portion of the ceiling plate is provided with a plurality of exhaust ports for exhausting the gas in the processing chamber. An exhaust pipe communicating with the exhaust ports and having an outlet at a point at equal distances from the exhaust ports is provided to be attachable and detachable to/from the lid body. According to the present invention, the maintenance work against clogging due to the impurities such as a sublimate and the like generated by the thermal processing can be easily performed.
Public/Granted literature
- US20070166655A1 THERMAL PROCESSING APPARATUS Public/Granted day:2007-07-19
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