Invention Grant
US07803517B2 Method of forming fine contact hole and method of fabricating semiconductor device using block copolymers
有权
形成微细接触孔的方法和使用嵌段共聚物制造半导体器件的方法
- Patent Title: Method of forming fine contact hole and method of fabricating semiconductor device using block copolymers
- Patent Title (中): 形成微细接触孔的方法和使用嵌段共聚物制造半导体器件的方法
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Application No.: US11590663Application Date: 2006-10-31
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Publication No.: US07803517B2Publication Date: 2010-09-28
- Inventor: Sung-chan Park , Chang-jin Kang
- Applicant: Sung-chan Park , Chang-jin Kang
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2006-0094329 20060927
- Main IPC: G03F1/00
- IPC: G03F1/00 ; B28B19/00

Abstract:
A method of forming a contact hole includes forming a plurality of lower patterns on a substrate. An insulation layer is formed on the lower patterns. A self-assemble induction layer is formed on the insulation layer. A recess is formed in the self-assemble induction layer in alignment with the lower patterns. A block copolymer layer is formed in the recess to form a polymer domain at a distance from a sidewall of the recess and a polymer matrix surrounding the polymer domain. The polymer domain is removed. The self-assemble induction layer is etched using the polymer matrix as a mask to form an opening through the self-assemble induction layer to expose the insulation layer. The insulation layer exposed by the opening is etched using the self-assemble induction layer as a mask so as to form a contact hole.
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