Method of forming a structure over a semiconductor substrate

Invention Grant

US07803678B2 Method of forming a structure over a semiconductor substrate 有权

Title translation: 在半导体衬底上形成结构的方法

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Patent Title: Method of forming a structure over a semiconductor substrate
Patent Title (中): 在半导体衬底上形成结构的方法
Application No.: US12145772

Application Date: 2008-06-25
Publication No.: US07803678B2

Publication Date: 2010-09-28
Inventor: Kevin L. Beaman , John T. Moore
Applicant: Kevin L. Beaman , John T. Moore
Applicant Address: US NY Mount Kisco
Assignee: Round Rock Research, LLC
Current Assignee: Round Rock Research, LLC
Current Assignee Address: US NY Mount Kisco
Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
Main IPC: H01L21/8234
IPC: H01L21/8234 ; H01L21/8238

Abstract:

The invention includes a method of forming a structure over a semiconductor substrate. A silicon dioxide containing layer is formed across at least some of the substrate. Nitrogen is formed within the silicon dioxide containing layer. Substantially all of the nitrogen within the silicon dioxide is at least 10Å above the substrate. After the nitrogen is formed within the silicon dioxide layer, conductively doped silicon is formed on the silicon dioxide layer.

Abstract(Chinese):

本发明包括在半导体衬底上形成结构的方法。在至少一些基底上形成含二氧化硅层。在含二氧化硅层内形成氮。基本上二氧化硅内的所有氮都在基材上方至少10埃。在二氧化硅层内形成氮之后，在二氧化硅层上形成导电掺杂的硅。

Public/Granted literature

US20080261388A1 Semiconductor assemblies, methods of forming structures over semiconductor substrates, and methods of forming transistors associated with semiconductor substrates Public/Granted day:2008-10-23

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L21/00	专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/70	.由在一共用基片内或其上形成的多个固态组件或集成电路组成的器件或其部件的制造或处理；集成电路器件或其特殊部件的制造（由预制电组件组成的组装件的制造入H05K3/00，H05K13/00）
H01L21/77	..在公共衬底中或上面形成的由许多固态元件或集成电路组成的器件的制造或处理（电可编程只读存储器或其多步骤的制造方法入H01L27/115）
H01L21/78	...把衬底连续地分成多个独立的器件（改变表面物理特性或者半导体形状的切割入H01L21/304）
H01L21/82	....制造器件，例如每一个由许多元件组成的集成电路
H01L21/822	.....衬底是采用硅工艺的半导体的（H01L21/8258优先）
H01L21/8232	......场效应工艺
H01L21/8234	.......MIS工艺