Invention Grant
- Patent Title: Highly integrated semiconductor device and method of fabricating the same
- Patent Title (中): 高度集成的半导体器件及其制造方法
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Application No.: US11600719Application Date: 2006-11-17
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Publication No.: US07803697B2Publication Date: 2010-09-28
- Inventor: Sung-Min Kim , Eun-Jung Yun
- Applicant: Sung-Min Kim , Eun-Jung Yun
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2005-0110004 20051117
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A method of fabricating a semiconductor device includes sequentially forming a first pattern and a second pattern on a substrate, the second pattern being a non-single-crystalline semiconductor stacked on the first pattern, wherein a portion of the substrate is exposed adjacent to the first and second patterns, forming a non-single-crystalline semiconductor layer on the substrate, the semiconductor layer contacting the second pattern and the exposed portion of the substrate, and, using the substrate as a seed layer, changing the crystalline state of the semiconductor layer to be single-crystalline and changing the crystalline state of the second pattern to be single-crystalline.
Public/Granted literature
- US20070111487A1 Highly integrated semiconductor device and method of fabricating the same Public/Granted day:2007-05-17
Information query
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